[2012][2011][2010] [2009][2008][2007] [2006][2005][2004] [2003][2002][2001]

2012年度
    1."Step-height measurement by low-coherence interferometry based on wavelet transform", T. Suzuki, S. Atsumi, O. Sasaki, and S. Choi, Imaging and Applied Optics Technical Digest(2012)
    2."Real-time displacement measurement using VCSEL interferometer", T. Suzuki, N. Yamada, O. Sasaki, and S. Choi, Proceedings of SPIE, Vol.8563(2012)
    3."Image detection of inner wall surface of holes in metal sheets through polarization using a 3D TV monitor", T. Suzuki, K. Nakano, S. Muramatsu, and T. Oitate, Proceedings of SPIE, Vol.8563(2012)
    4."Absolute measurement of optical surface profile with a Fizeau interferometer", O. Sasaki, A. Watanabe, S. Choi, and T. Suzuki, Proceedings of SPIE, Vol.8563(2012)
    5."Multi-frequency sweeping interferometry using spatial optical frequency modulation", S. Choi, O. Sasaki, and T. Suzuki, Proceedings of SPIE, Vol.8563(2012)
    6."Multi-frequency Sweeping Sinusoidal Phase Modulated Fizeau Interferometer for OCT", S. Choi, J. Hukumoto, O. Sasaki, and T. Suzuki, The 17th OptoElectronics and Communications Conference(2012)
2011年度
    7."Online optical verification system for sheet-metal processing", T. Suzuki, K. Sato, S. Muramatsu, M. Murata, and T. Oitate, Proceedings of SPIE, Vol.8201, pp.0B-1 - 0B-12(2011)
    8."Beam scanning laser interferometer with high spatial resolution over a large field of view", O. Sasaki, T. Saito, S. Choi, and T. Suzuki, Proceedings of SPIE, Vol.8201, pp.0J-1 - 0J-7(2011)
    9."Phase-shifting interferometer using a pulsed laser diode", T. Suzuki, T. Adachi, O. Sasaki, S. Choi, Proc. The ninth Japan-Finland Joint Symposium on Optics in Engineering(2011)
    10."Sinusoidal wavelength-scanning interferometers for shape measurement of thin films", O. Sasaki, H. Ueno, T. Suzuki, Proc. The ninth Japan-Finland Joint Symposium on Optics in Engineering(2011)
    11."Frequency comb generator using spatial frequency optical filter and its interferometric characteristics", S. Choi, H. Kato, O. Sasaki, and T. Suzuki, The ninth Japan-Finland Joint Symposium on Optics in Engineering(2011)
    12."Profile measurement of thin films by linear wavenumber scanning interferometry", O. Sasaki, S. Hirakubo, S. Choi, and T. Suzuki, Proceedings of SPIE, Vol.8133, pp.0K - (2011)
    13."Enhancement of optical gradient force employed in optical tweezers using a pulsed laser diode", T. Suzuki, T. Maeda, O. Sasaki, S. Choi, Proc. 2011 OSA Optics & Photonics Congress, pp.OTMD4p - (2011)
    14."Spectral interferometer using sinusoidal phase modulation and back-propagation method", S. Choi, K. Otsuki, O. Sasaki, and T. Suzuki, Conference on Lasers and Electro-Optics/Pacific Rim 2011(2011)
2010年度
    15."Profilometry using optical comb light source and sinusoidal phase modulation technique in Fizeau-type interferometer", S. Choi, H. Miyatsuka, O. Sasaki, T. Suzuki, Proc. of Photonics Asia 2010, Vol.7855, pp.19 (2010)
    16."Profile measurement with a spectral interferometer and the multiwavelength back-propagation method", K. Otsuki, S. Choi, O. Sasaki, T. Suzuki, Proc. of Photonics Asia 2010, Vol.7855, pp.26 (2010)
    17."Sinusoidal wavelength-scanning commonpath interferometer with a beam-scanning system for measurement of film thickness variations", O. Sasaki, T. Morimatsu, S. Choi, and T. Suzuki, Proceedings of SPIE, Vol.7855, pp.78550K (2010)
    18."Multiple-wavelength interferometers using backpropagation of optical fields for profile measurement of thin glass sheets", O. Sasaki, S. Choi, T. Suzuki, Proc. of SPIE, Vol.7790, pp.77900U - (2010)
    19."Step height measurement using a wavelength-selective multimode laser diode", T. Suzuki, A. Nomura, O Sasaki, Technical Digest of OSA Topical Meeting, pp.OMA4 - (2010)
    20."Three-dimensional profile measurement by use of phase-shifting digital holography based on a feedback technique", T. Suzuki, S. Suzuki, O Sasaki, Abstract Booklet of the 2010 International Symposium on Organic and Inorganic Materials and Related Nonotechnologies, pp.32 - (2010)
2009年度
    21."Inner surface profile measurement of a hydrodynamic bearing by an oblique incidence and two-wavelength interferometer", O. Sasaki, R. Yamamura, K. Yokoyama, T. Suzuki, Proc. SPIE, Vol.743 (2009)
    22."Measurement of thin film shape with a sinusoidal wavelength scanning interferometer using a white light source", O. Sasaki, H. Ueno, T. Suzuki, Proc. SPIE, Vol. 7511, pp.75110B - (2009)
    23."A tunable external cavity laser diode with no mechanical movement", T. Suzuki, R. Nagai, O Sasaki, Proc. of SPIE, Vol.7511, pp.7511O-1 - 7511O-9(2009)
2007年度
    24."Multiple-period fringe projection interferometry using a back-propagation method for surface measurement of glass plate", H. Huan, O. Sasaki, T. Suzuki, Proc. of SPIE, Vol.6829, pp.68290C - (2007)
    25."Sinusoidal wavelength-scanning interferometers for shape measurements", O. Sasaki, Proc. SPIE 6829, pp.60240Q - (2007)
    26."Multi-period fringe projection interferometry using back-propagation method for shape measurement of glass plate", Hai Huan, O. Sasaki, T. Suzuki, Proc. SPIE 6829, pp.68290C - (2007)
2006年度
    27."Sinusoidal wavelength-scanning interferometer for measurement of thickness and surface profile of thin films", H. Akiyama, O. Sasaki, T. Suzuki, Proc. of SPIE 6024, pp. 602409 - (2006)
    28."Vibration insensitive interferometer using sinusoidal phase-modulation and feedback control", O. Sasaki, H. Iwai, T. Suzuki, Proc. of SPIE 6024, pp.60240F - (2006) 29."Disturbance free phase-shifting laser diode interferometer", T. Suzuki, T. Takahashi, and O. Sasaki, Proc. of Frontiers in Optics 2006 on CD-ROM, pp.OFWD3 - OFWD3(2006)
2005年度
    30."Stroboscopic two-wavelength interferometer for disturbance-free step-height measurement", T. Suzuki, M. Ohida, K. Yokoyama, and O. Sasaki, Proc. of The 89th OSA annual meeting on CD-ROM, pp.JTuC7 - JTuC7(2005)
    31."Wavelength control in tunable external cavity laser diode", T. Suzuki, T. Iwana, and O. Sasaki, Proc. of The 89th OSA annual meeting on CD-ROM, pp.JTuC8 - JTuC8(2005)
    32."Displacement measurement with a dual-colored sinusoidal phase-modulating interferometer", T. Suzuki, T. Sato, O. Sasaki, Proc. of SPIE on CD-ROM ICO20, Vol.6024, pp.0101-12 - 0101-12(2005)
    33."Vibration insensitive interferometer using sinusoidal phase-modulation and feedback control", O. Sasaki, H. Iwai, T. Suzuki, Proc. of SPIE on CD-ROM ICO20, Vol.6024, pp.0101-25 - 0101-25(2005)
    34."Sinusoidal wavelength-scanning interferometer for measurement of thickness and surface profile of thin films", H. Akiyama, O. Sasaki, T. Suzuki, Proc. of SPIE on CD-ROM ICO20, Vol.6024, pp.0101-3 - 0101-3(2005)
    35."Measurement of diameter of metal cylinders using a sinusoidally vibrating interference pattern", J. Li, O. Sasaki, T. Suzuki, Proc. of SPIE on CD-ROM ICO20, Vol.6024, pp.0101-31 - 0101-31(2005)
    36."Displacement sensor by a sinusoidal phase-modulating laser diode interferometer using optical fibers", O. Sasaki, Y. Arakawa, T. Suzuki, IQEC and CLEO-PR 2005, Abstract on CD-ROM, pp.1695 - 1696(2005)
2004年度
    37."Measurement of sectional profile of a thread gauge using a sinusoidal vibrating light with sinusoidal intensity", J. Li, O. Sasaki, T. Suzuki, Proc. of Photonics Asia 2004, Vol.5633, pp.17 - 22(2004)
    38."One-dimensiona1 surface profile measurement with a fast scanning method by detecting angular deflection of a 1aser beam", R. Shinozaki, O. Sasaki, T. Suzuki, Proc. of Photonics Asia 2004, Vol.5633, pp.31 - 39(2004)
    39."Interferometric displacement sensors using sinusoidal phase-modulation and optical fibers", O. Sasaki, T. Suzuki, Proc. of Photonics Asia 2004, Vol.5633, pp.120 - 129(2004)
    40."Wide range two-dimensional small rotation-angle measurement by use of fringe projection", T. Suzuki, T. Endo, J. E. Greivenkamp, O. Sasaki, Proc. of Photonics Asia 2004, Vol.5633, pp.185 - 192(2004)
    41."Direct phase modulating laser diode interferometer for in-process measurement using sinusoidal signal synchronized with the CCD camera’s exposure time", X. Zhao, T. Suzuki, T. Masutomi, O. Sasaki, Proc. of Photonics Asia 2004, Vol.5633, pp.272 - 279(2004)
    42."Two-grating interferometer with sinusoidal phase modulation for surface profile", Y. Xu, O. Sasaki, T. Suzuki, Proc. of ICO 2004, pp.3 - 4(2004)
    43."Absolute distance measurement with a disturbance-free DSPM DBR laser diode interferometer", T. Suzuki, T. Ohizumi, O. Sasaki, Proc. of ICO 2004, pp.209 - 210(2004)
    44."Position measurement of reflecting surfaces by back-propagation of multiple-wavelength optical fields", O. Sasaki, K. Masui, T. Suzuki, Proc. of ICO 2004, pp.417 - 418(2004)
    45."Thickness and surface profile measurement by a sinusoidal wavelength-scanning interferometer", H. Akiyama, O. Sasaki, T. Suzuki, Proc. of ICO 2004, pp.419 - 420(2004)
    46."Measurement of sectional profile of a metal cylinder using a sinusoidally vibrating light with sinusidal intensity", J. Li, O. Sasaki, T. Suzuki, Proc. of ICO 2004, pp.437 - 438(2004)
    47."Interferometric fringe analysis by use of wavelet transform", T. Suzuki, J. Sato, O. Sasaki, Proc. of EM-NANO 2004, pp.86 - 86(2004)
    48."Two-dimensional small rotation-angle measurement by use of fringe projection", T. Endo, T. Suzuki, O. Sasaki, Proc. of EM-NANO 2004, pp.110 - 110(2004)
    49."Direct phase modulating interferometer by use of injection mode-locking laser diode", K. Aoki, T. Suzuki, Y. Ohdaira, O. Sasaki, Proc. of EM-NANO 2004, pp.111 - 111(2004)
    50."Sinusoidal phase modulating laser diode interferometer with double feedback loops for distance measurement", T. Iwana, T. Suzuki, O. Sasaki, Proc. of EM-NANO 2004, pp.114 - 114(2004)
    51."In-process surface profile measurement with a stroboscopic two wavelength interferometer", M. Ohida, T. Suzuki, O. Sasaki, Proc. of EM-NANO 2004, pp.250 - 250(2004)
    52."Polarizing Sagnac interferometer with a direct-modulated laser diode", M. Shirai, T. Suzuki, O. Sasaki, Proc. of EM-NANO 2004, pp.251 - 251(2004)
    53."Direct phase modulating laser diode interferometer using sinusoidal signal synchronized to the CCD camera’s shutter pulse", X. Zhao, T. Masutomi, T. Suzuki, O. Sasaki, Proc. of EM-NANO 2004, pp.252 - 252(2004)
    54."Interferometric displacement measurement by use of a time-shared two-wavelength laser diode", T. Suzuki, M. Mitomi, O. Sasaki, Proc. of CLEO/IQEC conference 2004 on technical digest CD-ROM, CTuX3, Vol.CTuX3(2004)
2003年度
    55."Optical telemeter system of rotating spindle temperature by adopting one-chip micro-controller - development of the system and measurement accuracy -", K. Yokoyama, Y. Nagaii, T. suzuki, S. Kobayashi, T. Kodera, Proc. of International conference on Leading Edge Manufacturing in 21st Century (LEM21), pp.489 - 494(2003)
    56."Real time estimation of ball-screw thermal elongation base upon temperature distributuion of ball screw", T. Kodera, K. Yokoyama, K. Miyaguchi, Y. Nagaii, T. suzuki, M. Masuda, T. Yazawa, Proc. of International conference on Leading Edge Manufacturing in 21st Century (LEM21), pp.495 - 500(2003)
    57."Modulation-amplitude-locked laser diode interferometry for distance measurement", T. Suzuki, T. Iwana, O. Sasaki, Proc. of SPIE International conference on Photonics Technologies for Automatuion and Manufacturing, Vol.5265, pp.120 - 126(2003)
    58."Stroboscopic step height measurement with two-wavelength interferometer using single diode laser source", X. Zhao, T. Suzuki, O. Sasaki, Proc. of SPIE International conference on Photonics Technologies for Automatuion and Manufacturing, Vol.5265, pp.127 - 132(2003)
2002年度
    59."Sinusoidal wavelength-scanning superluminescent diode interferometer for two-dimensional step-profile measurement", O. Sasaki, Y. Shimakura, T. Suzuki, Proc. of SPIE International conference on Advanced Materials and Devices for Sensing and Imaging, Vol.4919, pp.220 - 226(2002)
    60."Sinusoidal wavelength-scanning interferometer with double feedback control for real-time measurement of one-dimensional step-profile", O. Sasaki, K. Honma, T. Suzuki, Proc. of SPIE International conference on Advanced Materials and Devices for Sensing and Imaging, Vol.4919, pp.227 - 234(2002)
    61."Laser diode interferometers equipped with an electrical feedback loop (Invited)", T. Suzuki and O. Sasaki, Proc. of SPIE International conference on Advanced Materials and Devices for Sensing and Imaging, Vol.4919, pp.256 - 268(2002)
    62."Sinusoidal phase modulating laser diode interferometer using an additive operating type of integrating bucket method", X. Zhao, T. Suzuki, O. Sasaki, Proc. of SPIE International conference on Advanced Materials and Devices for Sensing and Imaging, Vol.4919, pp.275 - 282(2002)
    63."Absolute distance measurement with a sampling type of double sinusoidal phase-modulating laser diode interferometer", T. Suzuki, T. Sekimoto, O. Sasaki, Proc. of SPIE International conference on Advanced Materials and Devices for Sensing and Imaging, Vol.4919, pp.339 - 346(2002)
    64."Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control", O. Sasaki, K. Akiyama, T. Suzuki, Proc. of SPIE 19th congress of the international commision for Optics, Vol.4829, pp.829 - 830(2002)
    65."Coaxial type of self-mixing interferometer equipped with a wavelength stabilizing system", T. Suzuki, T. Irisawa, K. Yokoyama, O. Sasaki, Proc. of SPIE International Symposium on optical science and technology, Vol.4777, pp.49 - 56(2002)
2001年度
    66."Displacement measurement with a self-mixing interferometer equipped with a wavelength compensation system", T. Suzuki, T. Irisawa, O. Sasaki, Proc. of SPIE International Symposium on optoelectronics, photonics, and imaging, pp.83 - 83(2001)
    67."Measurement of cylinder diameter by using sinusoidally vibrating sinusoidal gratings", O. Sasaki, K. Hashimoto, Y. Fujimori, T. Suzuki, Proc. of SPIE International Symposium on optical engineering for sensing and nanotechnology, Vol.4416, pp.35 - 38(2001)
    68."Step-height measurement with a two-wavelength laser diode interferometer using time-sharing sinusoidal phase modulation", T. Suzuki, T. Yazawa, O. Sasaki, Proc. of SPIE International Symposium on optical engineering for sensing and nanotechnology, Vol.4416, pp.46 - 49(2001)
    69."High-speed sinusoidal phase modulating laser diode interferometer with a feedback control to eliminate external disturbance", T. Suzuki, T. Maki, O. Sasaki, Proc. of SPIE International Symposium on optical engineering for sensing and nanotechnology, Vol.4416, pp.392 - 396(2001)